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William C. Wake

William C. Wake's Blog

IEEE Software issue on Test-Driven Development

Posted by wwake on November 02, 2006 at 08:37 AM | Comments (0)

IEEE Software is going to have a special issue on test-driven development. Here's the call for papers: www.computer.org/portal/pages/software/content/cfp-May07_TDD.html

Papers are due by December 1, 2006; the issue will appear in May/June 2007.


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